2024
- Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor. Proceedings of the IEEE 62nd International Reliability Physics Symposium (IRPS'24), 2024 more…
2023
- Cryogenic CMOS for Quantum Processing: 5-nm FinFET-Based SRAM Arrays at 10 K. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) PP, 2023, 1-14 more… Full text ( DOI )
- Performance and Energy Studies on NC-FinFET Cache-Based Systems With FN-McPAT. IEEE Transactions on Very Large Scale Integration (VLSI) Systems (TVLSI) 31 (9), 2023, 1280-1293 more… Full text ( DOI )
- Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths. 2023 IEEE International Reliability Physics Symposium (IRPS), 2023 more… Full text ( DOI )
- Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023 more… Full text ( DOI )
- Design Automation for Cryogenic CMOS Circuits. Proceedings of the 60th Annual Design Automation Conference (DAC), 2023 more… Full text ( DOI )